Scope and Mission
Troubleshooting how and why circuits and systems fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, debugging the design function, failure mode learning for R&D, or just getting a working first prototype. But the detective work can become tricky. Sources of difficulty include, circuit complexity, packaging, physical access, shortened product creation cycle, the traditional focus on just pass/fail testing and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity. The mission and objective of the SDD Workshop is to consider all issues related to debug and diagnosis of circuits and systems - from prototype bring-up to volume production.

Summary of SDD 2004 The topics of interest include, but are not limited to, the following:

Debug Techniques and Methodologies

Structured Debug Architectures

Infrastructure IP for SDD

Design/Synthesis for Debug

Microprocessor Debug

Debug for FPGAs

Reuse of DFT for Debug and Diagnosis

Debug of Embedded Cores/SoCs

Silicon Debug Tools

Diagnosis Methods and Tools

System Level Debug

Silicon Debug Standardization

Equipment Impact and Techniques

Manufacturing & Prototype Environment

Prototype Turn-on

Board/System Level Debug & Diagnosis

Impact of Defect Models vs. Fault Models

Program Committee

Miron Abramovici

Rob Aitken

Davide APPELLO

Bart Vermeulen

Christian Boit

Dwayne Burek

Wu-tung Cheng

Bruce Cory

Al Crouch

Erik-Jan

Joan Figueras

Dimitris Gizopolos

Kazumi Hatayama

Yu-Chin Hsu

Doug Josephson

Rohit Kapur

Hans Kerkhoff

Matteo Sonzareorda

Teresa Mclaurin

Cecilia Metra

Bob Molyneaux

Alex Orailoglu

Micheal Renovell

Gord Roberts

Shrikanth Venkataraman

Chinsong Sul

Jerzy Tyszer

Burnie West

Tom Williams

Yervant Zorian