Silicon Debug and Diagnosis - SDD07
Dorint Hotel, Freiburg, Germany
May 23rd-24th, 2007
Held in conjunction with the IEEE European Test Symposium 2007
| SDD 2005 | SDD 2006 | Call for Papers | Submission | Advance Program | Registration |
R. Aitken – ARM
Program Chair:
B. Vermeulen – NXP Semi.
Past Program Chair:
F. Muradali – National Semi.
Special Session Chair:
N. Nicolici – McMaster U.
Finance Chair:
M. Ricchetti – AMD
Arrangements Chair:
S. Goel – Novas
Local Arrangements:
S. Disch – U. Freiburg
Electronic Media:
I. Bayraktaroglu – Sun
Program Committee:
M. Abramovici – DAFCA
D. Appello – ST Microelectronics
C. Boit – TU Berlin
W-T Cheng – Mentor Graphics
B. Cory – nVidia
A. Crouch – Inovys
J. Figueras – U. Barcelona
D. Gizopoulos – U. Piraeus
I. Hartanto – Xilinx
K. Hatayama – STARC
Y-C. Hsu – Novas
D. Josephson – Intel
R. Kapur – Synopsys
H. Kerkhoff – U. Twente
C. Landrault – LIRMM
T. McLaurin – ARM
C. Metra – U. Bologna
Y. Okuda – Sony
A. Orailoglu – UCSD
P. Prinetto – Poli. Di Torino
M. Renovell – LIRMM
M.S. Reorda – Poli. Di Torino
N. Stollon – First Silicon Solutions
C. Sul – Silicon Image
J. Tyzer – U. Poznan
S. Venkataraman – Intel
B. West
H. Wienrich – National Semi.
Steering Committee:
R. Aitken – ARM
F. Muradali – National Semi.
E.J. Marinissen – NXP Semi.
M. Ricchetti – AMD (chair)
T. W. Williams – Synopsys
Y. Zorian – Virage Logic
Scope and Mission
Troubleshooting how and why systems and circuits fail is important and is rapidly growing in
industry significance. Debug and diagnosis may be needed for yield improvement, process
monitoring, correcting the design function, failure mode learning for R&D, or just getting a
working first prototype. This detective work can however become very tricky. Sources of difficulty
include circuit and system complexity, packaging, limited physical access, shortened product
creation cycle and time-to-market, the traditional focus on only pass/fail testing and missing tool
and equipment capabilities. New and efficient solutions for debug and diagnosis will have a
much needed and highly visible impact on productivity. The mission and objective of the SDD’07
Workshop is to consider all issues related to debug and diagnosis of systems and circuits – from
prototype bring-up to volume production.
Advance Program Overview
The SDD'07 Advance Program is printed on the back of this Call for Participation. This high quality
program covers an entire range of silicon debug and diagnosis topics, with presenters
providing details of their recent results on fault diagnosis, process debug, micro-processor
debug, and system-level debug. This year there is a special session on the application uses of
FPGAs and configurable logic for debug and diagnosis, and a panel of debug experts to explore
and discuss the possibilities for fostering further collaboration between the industry, tool
vendors, and academia in the field of silicon debug and diagnosis.
Workshop Registration
The registration for SDD'07 has now been opened. More details on the registration process can
be found at http://evia.ucsd.edu/conferences/sdd/07/registration
About Freiburg
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Freiburg (http://www.freiburg.de) is the sunniest city in southern Germany and the capital of the Black Forest. Freiburg has even more to offer to you besides ETS and SDD 2007 because of its proximity to France and Switzerland: its rich cultural offerings and a high number of international visitors. Freiburg has a very special air and charm. Come and attend the Silicon Debug and Diagnosis Workshop 2007 and enjoy this unique region! |
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For general information contact: R. Aitken (rob.aitken@arm.com) |
For program information contact: B. Vermeulen (bart.vermeulen@nxp.com) |
SDD07 is sponsored by the IEEE Computer Society Test Technology Technical Council.
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